FlexSEM 1000 II
Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electrical optical system with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm.
Lithium-ion battery materials are highly sensitive to air exposure. It’s not feasible to establish an assembly line where the product is isolated from the atmosphere, therefore a glovebox is used that ensures the material is not fragilized during the analysis process.
Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electrical optical system with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm.
SU3800 & SU3900 SEM incorporates new Intelligent Filament Technology which allows the user to work with a constant and extremely stable emission current for all acceleration voltages.
SU3900 is more adapted for large samples.
Schottky FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes.
Ultra high-resolution cold-field emission scanning electron microscopes. Bringing imaging, automation, increased system stability for efficient workflows.
FE SEM ultra high-resolution for wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.
Fill in the form below to download the brochure
Sample preparation equipment for clear structural analysis
Active material particules
Electrodes
Separator
Low-kV study of coating homogenity
on cathode particle.
Foreign particle inclusions
Critical, as they might punch separators and
cause failure.
Separators exhibit very beam-sensitive ultra-fine fibril structures, which are easily altered or damaged during SEM inspection, Serial Frame Capture allows proper image.
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Widths up to 8 mm with milling rate: 1 mm/hour.
High performance ion milling systems for incredible results with cross section analysis
Active material particle
Inner structure
Separator
Electrodes
Prepared with IM5000 in less than one hour. Observed with FE-SEM SU7000.
Using Cryo Temperature Control of IM5000, layer thicknesses and fibril structures are maintained.
Observed with Cold FE-SEM.
Prepared with IM5000.
Observed with FE-SEM SU7000.
IM4000II supports both cross section milling and/or flat-milling to prepare specimens depending on the purpose. Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.
For specimen exchange, discover the advantages of air protected transfer for processing & observation workflow