Vista 200
Le microscope à force atomique Vista 200 est une solution avancée spécifiquement conçue pour l’analyse des semi-conducteurs.
Ultra-High-Resolution Schottky Scanning Electron Microscope
The new Hitachi SU7000 Ultra High Resolution Hot Cathode Analytical Field Effect SEM meets the new and increasingly diverse requirements of advanced research units or industrial quality control departments.
The SU7000 combines ultra high resolution (less than 1nm over the entire range of acceleration voltages) with outstanding analytical performance (max probe current of 200nA, 6mm analytical distance for all detectors).
Equipped with a very large chamber, the SU7000 has 18 access ports for the installation of additional devices. The 5-axis motorised, high displacement eucentric stage is robust and easily accessible from outside the chamber for sample placement.
The SU7000 features a low vacuum mode, with a wide range of chamber pressure settings up to 300 Pa.