Physical Electronics (PHI) PHI Genesis
Fully Automated Multi-Technique Scanning XPS/HAXPES Microprobe
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Very Large Specimen Chamber Field Effect Variable Pressure SEMThis product is available from Milexia France
The Hitachi SU3900 MEB incorporates new IFT technology which allows the user to work with a constant and extremely stable emission current for all acceleration voltages.
In addition, the software informs in real time of the remaining life of the filament. Lifetime is typically increased by a factor of x3.
The neat ergonomics ensure easy access to the functions of the microscope, via the control panel or via the software while fast automatism’s maximize productivity.
The control electronics of the very high sensitivity five-sector BSE detectors and the optional UVD II detector for variable pressure mode, have been optimized to allow real-time, high-speed sample visualization, as is already the case with the secondary electron detector SE of the Everhart-Thornley type.
The chamber has many access ports for additional equipment (EDS, WDS, EBSD, Cryo, STEM detector, etc.), the motorized stage on 5 continuous axes is compucentric in inclination and rotation.
Finally, an optical camera integrated in the chamber makes it possible to obtain an image of the sample during the pumping of the chamber, to move in real time to choose the region of interest and to superimpose the optical and electronic images with a factor of user-adjustable transparency