FlexSEM 1000 II
Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electrical optical system with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm.
Lithium-Ion Batteries (LIBs)
Electron Microscope Technologies to design safer & more sustainable batteries.
With a range of characteristics such as fluid, sheet and powder, their complex balance needs to be assessed, controlled and observed before, during and after assembly.
Lithium-ion battery materials are highly sensitive to air exposure. It’s not feasible to establish an assembly line where the product is isolated from the atmosphere, therefore a glovebox is used that ensures the material is not fragilized during the analysis process.
Several factors are significant in this complex process and we can provide the solution you need.
- Fine Raw material structure (down to the atomic level)
- Power coating thickness
- Internal structure and elemental distribution mappings
- Homogeneity of solid state electrodes
- 3D volume analysis
- Chemical analysis if SEM is not enough
SU3800 & SU3900
SU3800 & SU3900 SEM incorporates new Intelligent Filament Technology which allows the user to work with a constant and extremely stable emission current for all acceleration voltages.
SU3900 is more adapted for large samples.
SU5000
Schottky FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes.
SU8600
Ultra high-resolution cold-field emission scanning electron microscopes. Bringing imaging, automation, increased system stability for efficient workflows.
SU7000
FE SEM ultra high-resolution for wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.
Download our Brochure
Find more in-depth information and advice in our brochure on scanning electron microscopy and surface analysis for batteries.
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Sample preparation equipment for clear structural analysis
Active material particules
- Sizing & Shapes
- Outer grain structrure
- Surface coating
Electrodes
- Topography
- Foreign matter
Separator
- Fibril & pore structure
- Foreign matter
- Ceramics coating damage
Cathode observed on FE-SEM SU5000
Low-kV study of coating homogenity
on cathode particle.
Anode Inspection observed on W-SEM FlexSEM 1000 II
Foreign particle inclusions
Critical, as they might punch separators and
cause failure.
Separator observed on FE-SEM
Separators exhibit very beam-sensitive ultra-fine fibril structures, which are easily altered or damaged during SEM inspection, Serial Frame Capture allows proper image.
Product spotlight IM5000
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Widths up to 8 mm with milling rate: 1 mm/hour.
High performance ion milling systems for incredible results with cross section analysis
Active material particle
Inner structure
- Grainpores, cracks, core-shell structure (anti-corrosion)
Separator
- Inner structure, layer thickness
Electrodes
- Geometrical structure (filling, porosity, cracks, binder distribution, rolling damage) aging analysis
Cross Section of Cathode
Prepared with IM5000 in less than one hour. Observed with FE-SEM SU7000.
Cross Section of Separator
Using Cryo Temperature Control of IM5000, layer thicknesses and fibril structures are maintained.
Observed with Cold FE-SEM.
Cross Section of Anode
Prepared with IM5000.
Observed with FE-SEM SU7000.
Product spotlight IM4000 II
IM4000II supports both cross section milling and/or flat-milling to prepare specimens depending on the purpose. Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.
How can we help you?
Get great, friendly, free advice from our expert team of technologists and engineers.Discover Air Protection Solution
For specimen exchange, discover the advantages of air protected transfer for processing & observation workflow
