Ethos NX5000 Focused Ion Beam System
Unsurpassed Performance with Ultimate Flexibility
Hitachi High-Tech is a global leader in electron microscopy and advanced analytical instrumentation, renowned for its technological innovations since 1947. Represented by Milexia France since 1983, the company provides cutting-edge solutions in microscopy, sample preparation, and analytical instrumentation.
Hitachi High-Tech is also the global leader in critical dimension SEM (CD-SEM) metrology systems for semiconductor manufacturing facilities.
Products from Hitachi High Tech
in Scientific Instrumentation
Regional availability
UV Cleaner Hitachi zone Tem II
Hydrocarbon compounds surface decontamination
Hitachi Ion Polisher IM4000 II & ArBlade IM5000
The latest generation of Hitachi ion polishers are suitable for large surface preparation.
UV Cleaner Hitachi zone sem II
Analyze samples in the SEM without contamination
TM4000 Electron Microscope
High‑resolution scanning electron microscopes.
TM4000III & TM4000PlusIII
Tabletop Microscope
FineSAT V
Scanning Acoustic Microscop
FlexSEM1000 II
Compact Scanning Electron Microscope
Hitachi HT7800 TEM Series
Low Voltage TEM (120kV)
HItachi H-9500 TEM
High Voltage TEM (300kV)
Hitachi HF-5000 TEM/STEM
200 kV aberration-corrected TEM/STEM
Hitachi Field Emission HF-3300 TEM
High Voltage TEM FEG (300kV)
NX-9000 Focused Ion Beam System
FIB-SEM System for True 3D Structural Analysis
NX-2000 Focused Icon Beam System
FIP-SEM for large samples up to 200mm
SU3800
Variable Pressure Scanning Electron Microscope
SU3800SE / SEPlus
High Resolution Schottky Scanning Electron Microscope
SU3900SE / SE Plus
High Resolution Schottky Large Chamber Scanning Electron Microscope
Hitachi – SU3900SE
Schottky field emission SEM with variable pressure and extra‑large specimen chamber.
SU3900
Very Large Specimen Chamber Variable Pressure SEM
SU5000
Field emission & variable pressure scanning electron microscope
SU8600
Hitachi Ultrahigh-resolution Field-emission Scanning electron microscope
SU9000 II
Ultra-high Resolution Scanning Electron Microscope
SU7000
Ultra-High-Resolution Schottky Scanning Electron Microscope
HiLEM IL1000 Ionic Liquid
Hitachi Innovation for Hitachi Electron Microscopes. The Latest in Sample Preparation.
Founded in April 1947, Hitachi High-Tech is a global leader in electron microscopy and advanced analytical instrumentation. Through a continuous innovation strategy and rigorous quality control, the company has established a dominant position in numerous scientific and industrial fields.
Hitachi notably introduced the world’s first commercial field-emission scanning electron microscope (FEG-SEM) in 1972 and the first commercial tabletop SEM in 2005.
The European headquarters of Hitachi High-Tech is located in Krefeld, near Düsseldorf, Germany. In France and French-speaking territories including Belgium and Luxembourg, Milexia France has represented Hitachi High-Tech since 1983.
Milexia France markets a wide range of equipment including scanning and transmission electron microscopes (SEM and TEM), focused ion beam systems (FIB) and sample preparation equipment (ion milling systems and UV cleaners).
Case Studies
Installation of the Hitachi SU5000 Scanning Electron Microscope
To support the development of next-generation steels and decarbonized solutions, ArcelorMittal Global R&D Maizières Products partnered with Milexia to install the Hitachi SU5000 scanning electron microscope.
Installation of the High-Resolution Hitachi SU7000 Microscope at Placamat
PLACAMAT is a research and development center based in Bordeaux, specialising in the advanced characterisation of nanostructured materials.
LISA (Laboratoire Interuniversitaire des Systèmes Atmosphériques)
Milexia France installed the Hitachi SU8600 and the Hitachi TM4000Plus II at the LISA (Laboratoire Interuniversitaire des Systèmes Atmosphériques) in Créteil, France.
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