Vista 200
Le microscope à force atomique Vista 200 est une solution avancée spécifiquement conçue pour l’analyse des semi-conducteurs.
S lynx 2
The S lynx 2 is a compact and versatile 3D optical system for roughness, volume, and critical dimensions measurements.
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The S lynx 2 is equipped with three very powerful measuring techniques: Interferometry, Confocal, and Ai Focus Variation – each faster than the last
This dynamic trio allows for data collection across a wide range of materials using the optimal technology for every surface, guaranteeing unparalleled measurement accuracy.
The advanced stitching capabilities allow you to capture high-resolution data over larger areas. Our innovative algorithms cover the entire motorized stage range, spanning an impressive 125 x 75 mm for the system’s compact size.
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