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Distributing and maintaining scientific equipment for nearly 40 years

Milexia France has been distributing and maintaining scientific equipment for nearly 40 years in France, Walloon Belgium, Luxembourg, French-speaking Switzerland and occasionally in the Maghreb countries.

We are the French-speaking partner of world-renowned companies, Hitachi High Tech for electron microscopy, FIBs, Thermo Scientific for X-ray microanalysis, Sensofar for optical profilometry, Rigaku for diffraction and elementary analysis equipment dedicated to the semiconductor industry.

We are able to offer our customers complete solutions with a single point of contact for sales, applications and after-sales support. We benefit from recognised experience acquired in contact with production units, particularly in the field of semiconductors.

Scientific Instrumentation product groups

Scanning Electron Microscopy (SEM)

Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance

Transmission Electron Microscopy (TEM)

A range of Transmission Electron Microscopes (TEM) suitable for structural and chemical characterizations including nanomaterials, semiconductors, energy technology, polymers, glassy materials and biomolecular mechanisms of disease.

SEM Accessories

Accessories to provide the latest capabilities for your Electron Microscopy instruments

X-Ray Microanalysis (EDX)

X-ray micro-analysis for SEM/EDS and SEM/WDS avoids the many pitfalls found in traditional elemental-based X-ray micro-analysis.

Metrology

Non-contact 3D surface profilers and integrable solutions to provide you with a tool that increases the quality of your products.

Atomic Force Microscopy (AFM)

The best solution instruments for anyone working with nano‑scale materials, chemistry, or physics.

Acoustic Tomography

Non-destructive equipment for detecting and imaging microscopic structures or defects inside semiconductors and electronic components.

X-Ray Fluorescence

The latest in general purpose micro spot energy dispersive X-ray fluorescence spectrometer microscopes for the measurement and mapping of elements from sodium through to uranium.

Focused on Ion Beam

High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation

Sample preparation equipment for SEM

Sample preparation equipments for SEM

Sample preparation equipment for TEM

Sample preparation equipment for TEM

MET Cameras

MET Cameras for high quality imaging

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    Services & Support

    You will have excellent service and expert support based on years of experience and understanding of what our customers need – both from their application and from us.