Vista 200
Le microscope à force atomique Vista 200 est une solution avancée spécifiquement conçue pour l’analyse des semi-conducteurs.
Hitachi Ion Polisher IM4000 II & ArBlade IM5000
The latest generation of Hitachi ion polishers are suitable for large surface preparation.
This product is available from Milexia France and Milexia Iberica
The Hitachi IM4000 II and ArBlade 5000 ion polishers are compatible for :
- Cross Section ion polishing: used to produce large, uniform cross sections without applying mechanical stress to the sample
- flat ion polishing of large samples, also known as “flatmilling”: used to eliminate surface artefacts and to finalise/finish the polish after mechanical polishing
- Precise positioning of the sample on the removable stage
- Cooling of the sample
- Programming of sequences
- Monitoring via an additional optical microscope (optional)
Resources
Download the AirBlade 5000 Brochure 2020
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