Surface Analysis

Operating since 1969, the company has more than half a century of experience developing equipment for surface analysis.

As innovators who developed an influential XPS Surface Analysis Equipment Auger Electron Spectrometer (AES) as their first product, they continue to shape the field with cutting-edge tools to serve the three major surface analysis methods.

Recent developments include its Genesis XPS System, which brings together every surface analysis technology needed for battery research into a single, advanced platform.

Milexia is proud to connect its clients to PHI as a single, comprehensive source of leading surface analysis equipment, covering TOF-SIMS, AES and XPS with equal quality. Users are able to benefit from sales, training and maintenance engineers who are all trained directly by a single manufacturer and deeply experienced with PHI systems.

As a result, Milexia customers have ultimate confidence that they are securing maximum performance from their surface analysis equipment.

It has been designed with a ‘no compromise’ ethos, attaining maximum analytical performance for users.

It uses a synergistic design to successful integrate multiple resolution types into a unified, easy to use HR2 mode of analysis. Users benefit from excellent lateral and mass resolutions simultaneously.

Patented mass spectrometer technology offers high mass resolution and mass accuracy over the entire range, producing peerless imaging for even the most highly topographic samples.

Patented technology for pulsed dual-beam charge neutralization, along with a bi-cluster emitter with small beam diameter, make this the defining choice for insulator analysis and high throughput HR2 analysis.

The nanoTOF 3 is built for efficacy and ease of use, with no compromise between the two. Between a 5-axis sample rotation function at the same stage, plus active control of temperature, powerful software integration and automated workflows, analysis is fast and reliable.

Learn more about the PHI nanoTOF 3

Users can derive chemical and elemental state information at nanoscale, as well as across thin films and interfaces.

This instrument delivers using a number of unique technological features. These include a coaxial electron gun and analyzer geometry, allowing full microstructure characterisation.

Auger maps are constructed using data from all sides of the sample, creating meaningful compositions, as well as imaging of curved and textured samples without shadowing.

AES surface analysis users will have access to magnification up to 500,000x and a range of depth profiling capabilities. High ion beam energies and lower accelerating voltages allow for accurate, fine detail imaging of structures at micro and nano levels.

Like all PHI surface analysis products, it is supported by powerful, Windows integrated software packages designed for high performance spectroscopy.

Learn more about the PHI 710

Milexia customers can access excellent X-ray Photoelectron Spectroscopy (XPS) performance capabilities through the PHI Genesis, a fully automated scanning XPS/HAXPES microprobe with multi-technique scanning.

At its core is PHI’s patented micro-focused, monochromatic scanning X-ray source, offering high throughput and sensitivity. This is across both large area and small samples, for which the PHI Genesis offers market-leading sensitivity, as low as 5 µm. The Genesis XPS microprobe supports advanced material study with a range of sputter ion sources, multiple excitation sources, and streamlined sample treatment and transfer functionality.

The system is built to deliver XPS surface analysis performance in a highly accessible and adjustable format, with features such as auto tuning and calibration, plus multiple parking positions, enabled by intelligent automation systems.

Most importantly, this unit is highly customisable. Milexia customers can work with expert engineers to plan their configuration, bringing in custom adjustments and accessories to perfectly align with the needs of their project.

Learn more about the PHI Genesis