Scientific Instrumentation product categories
available in France
Atomic Force Microscopy (AFM)
The best solution instruments for anyone working with nano‑scale materials, chemistry, or physics.
Focused Ion Beam
High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation
Optical profilometry
Non-contact 3D surface profilers and integrable solutions to provide you with a tool that increases the quality of your products.
Sample preparation equipment for SEM
Cryo preparation systems, carbon coaters, glow discharge and critical point dryers to maximize resolutions
Sample preparation equipment for TEM
Sample preparation equipment for TEM
Scanning Acoustic Tomography
Non-destructive equipment for detecting and imaging microscopic structures or defects inside semiconductors and electronic components.
Scanning Electron Microscopy (SEM)
Standard and variable pressure scanning electron microscopes (SEM & VP-SEM), ultra high resolution cold cathode or hot cathode (FEG-SEM), with innovative electron optics and signal detection systems offering unmatched imaging and analysis performance.
SEM Accessories
Accessories to provide the latest capabilities for your Electron Microscopy instruments
Surface Analysis
SIMS, AES and XPS Surface Analysis equipment
TEM Accessories
MET Cameras, sample holders for high quality imaging
Transmission Electron Microscopy (TEM)
A range of high and low voltage TEMs to characterise structure and chemical samples composition in materials science and the characteristics of cells in biology or medicine
X-Ray Fluorescence
The latest in general purpose micro spot energy dispersive X-ray fluorescence spectrometer microscopes for the measurement and mapping of elements from sodium through to uranium.
X-Ray Microanalysis (EDX) & Microfluorescence X (μXRF)
Energy dispersive X-ray microanalysis is an ideal complement to the scanning or transmission electron microscope. In the case of SEM, EDS can be complemented by WDS (wavelength dispersive X-ray microanalysis), µXRF (X-ray microfluorescence) and EBSD to access structural information.