MiniQS
El MiniQS es ideal para el usuario que necesita resultados de calidad reproducibles en un instrumento fácil de usar.
FIB-SEM Triple Beam
The Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for nanoscale precision processing.
Refined Electron Optics and Multi-Signal Detection
The Ethos SEM column is composed of a magnetic- and electrostatic-field compound objective lens system configured as two lens modes.
High Resolution (HR) mode achieves sample observation at ultimate resolution by immersing the sample within the magnetic field of the lens system. Field Free(FF) mode offers real-time FIB processing for high accuracy end point milling.
Hyper switching between FIB irradiation and SEM imaging as fast as 10 nsec offers real-time fabrication and observation views with clarity. Fast SEM and IM imaging enables users to quickly find the area of interest with ease.
Key Features
1. High-Performance FE-SEM Column with Dual Lens Mode
2. High-Throughput Material Processing
3. Microsampling System
4. Triple-Beam Capable, Delivering Advanced Quality Results
5. Large Multi-Port Chamber and Stage for Various Applications