Scientific Instrumentation product categories
available in Ibérica
Focused Ion Beam
High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation
Sample preparation equipment for SEM
Cryo preparation systems, carbon coaters, glow discharge and critical point dryers to maximize resolutions
Sample preparation equipment for TEM
Sample preparation equipment for TEM
Scanning Electron Microscopy (SEM)
Standard and variable pressure scanning electron microscopes (SEM & VP-SEM), ultra high resolution cold cathode or hot cathode (FEG-SEM), with innovative electron optics and signal detection systems offering unmatched imaging and analysis performance.
SEM Accessories
Accessories to provide the latest capabilities for your Electron Microscopy instruments
Transmission Electron Microscopy (TEM)
A range of high and low voltage TEMs to characterise structure and chemical samples composition in materials science and the characteristics of cells in biology or medicine