Vista 200
Le microscope à force atomique Vista 200 est une solution avancée spécifiquement conçue pour l’analyse des semi-conducteurs.
TM4000 II & TM4000Plus II
Tabletop Microscope
This product is available from Milexia France and Milexia Iberica
The new generation of Hitachi TM4000 II and TM4000 Plus II Benchtop Scanning Electron Microscopes meet the needs of all laboratories that want to check the topography of their samples from millimeter to submicron scale and determine their chemical composition.
The new optical sample viewer makes it easy to locate areas of interest and automatically navigate through multiple sample holders.
The “controlled pressure” mode allows direct observation of all types of samples, conductive or insulating, dry or wet.
A specific electron detector of very high sensitivity restores topographic and atomic number contrast information, up to magnifications of x250.000 (x100.000 in polaroid format). Extreme surface information is revealed by the use of a low acceleration voltage combined with an excellent signal to noise ratio.
The TM4000 Plus also has a secondary electron detector (UVD).
An energy-selective X-ray spectrometer (EDS) using a large-area Silicon Drift Detector (SDD) determines the composition from the Boron element and enables elemental mapping.
Hitachi integrates either the Bruker Quantax 75 or the Oxford Aztec model.
With more than 3,700 units installed worldwide, Hitachi confirms its position as the global market leader in Benchtop Scanning Electron Microscopes (also known as MiniMEB™ or benchtop SEM).
Features and variations
- Simple, intuitive operation
- Little sample preparation
- High sensitivity BSE detector - various imaging possibilities thanks to the 4-segment BSE detector
Resources
Download the HITACHI TM4000 II Brochure
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