SEM Peltier Heating & Cooling
The Specimen Current-EBIC Amplifier is designed to operate with small currents absorbed by the sample in a Scanning Electron Microscope.
It gives accurate absorbed current measurements but will also provide images over a wide range of probe currents. At the higher probe currents, TV rate images are possible, and at slow scan, low noise images can be produced. A differential input capability permits the specimen to be floated by up to 5 volts from ground.