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S Neox

non-contact 3D optical profilometer Sensofar S NEOX

K1050

Plasma Etcher

Modern, solid-state RF plasma barrel reactor

Critical Point Dryers

Dehydrating biological tissue

Cryo Deck

Excellent for liquids, semi-liquids, foams and beam sensitive specimens

coaters

Coaters

For ultra high resolutions

Metallizers Standard & High Resolution

Primary & Secondary vacuum metallizers

Zone SEM II

Analyse samples in the SEM without contamination

Ionic Polisher IM4000 Plus & Arblade 5000

The latest generation of Hitachi ion polishers are suitable for large surface preparation.

TM4000 II TM4000PLUS II

Tabletop Microscope

SEM Specimen Current EBIC Amplifier

Microscope Accessory Solutions

S Neox Five Axis

Complete 3D Measurement Solution

S Wide

Large Area 3D Optical Metrology System

S Lynx

3D optical profilometer

S Mart II

Unprecedented high speed

Vista-IR

Near-Field Infrared Microscopy

S Onix

Optical 3D module for surface Inspection

FineSAT V

Scanning Acoustic Tomograph

ATLAS™ Software

Unparalleled Micro-XRF Performance

ATLAS™ X Micro-XRF spectrometer

Unparalleled Micro-XRF Performance

ATLAS™ Micro-XRF spectrometer

Unparalleled Micro-XRF Performance

Ethos NX5000

Focused Ion and Electron Beam System

FlexSEM1000 II

Scanning electron microscope

HT7800 low voltage TEM

Expanding the boundaries of Electron Microscopy

H-9500 high voltage TEM

High performance, high resolution, stability and reliability.

HD-2700 STEM

Hitachi Spherical Aberration Corrected STEM

H-3300 high voltage TEM

High performance, high resolution, stability and reliability.

NX-9000 Focused Icon Beam System

FIB-SEM System for True 3D Structural Analysis

NX-2000 Focused Icon Beam System

Ultra-High Resolution Field Emission Scanning Electron Microscope

SU3800 Scanning Electron Microscope

Performance and Power in a Flexible Platform

SU3900 Scanning Electron Microscope

Performance and Power in a Flexible Platform

SU5000 Scanning Electron Microscope

Field emission/variable pressure scanning electron microscope

SU7000 Scanning Electron Microscope

Ultra-High-Resolution Schottky Scanning Electron Microscope

SU8600 Scanning Electron Microscope

Hitachi Ultrahigh-resolution Field-emission Scanning electron microscope

SU8700 Scanning Electron Microscope

Ultra-High Resolution Field Emission Scanning Electron Microscope

SU9000 Scanning Electron Microscope

Ultra-high Resolution Scanning Electron Microscope

Triple Beam

TemCam-XF416(ES)

CMOS based TEM cameras for high-end scientific imaging in Transmission Electron Microscopy

GloQube®

Glow discharge system for TEM grids

SC7620

‘Mini’ Sputter Coater/Glow Discharge System

MagnaRay

Wavelength Dispersive Spectrometer

Pathfinder X-ray Microanalysis Software

The premier platform for EDS/WDS analysis in the electron microscope

EDS + muXRF

microXRF for SEM

The Thermo Scientific™ Lumis™ Electron Backscatter Diffraction (EBSD)

Crystallography and microstructural measurement for SEMs

Climate In Situ TEM Gas & Heating Solution

Allows the nanoscale world to be studied in a real gas and heating environment.

HiLEM IL1000 Ionic Liquid

Hitachi Innovation for Hitachi Electron Microscopes. The Latest in Sample Preparation.

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